- Enables a variety of configurations by allowing testing of separate devices to be tested simultaneously
- Small yet powerful for Automated Test Equipment (ATE) systems
To help engineers and scientists make accurate measurements of frequency signals generated for 5G networks, data centres, commercial and military aircraft systems, space vehicles, communication satellites and metrology applications, Microchip Technology has announced the new 53100A Phase Noise Analyzer.
This phase noise test instrument.is capable of measuring radio frequency (RF) signals up to 200 MHz. It is also capable of rapidly acquiring frequency signals and characterize the phase noise, jitter, Allan deviation (ADEV) and time deviation (TDEV) precisely within minutes.
The 53100A Phase Noise Analyzer enables a variety of configurations by allowing up to three separate devices to be tested simultaneously using a single reference, thus enabling higher capacity for stability measurements. It provides backward compatibility with Microchip’s 51xxA test sets’ command and data stream, which eliminates the need to redesign existing Automated Test Equipment (ATE) infrastructure.
The 53100A Phase Noise Analyzer provides flexibility by allowing an input reference device to be connected through the front panel at a different nominal frequency than the device under test – allowing a single reference to characterize a variety of oscillator products. Rubidium frequency standards such as Microchip’s 8040C-LN or a quartz oscillator such as Microchip’s 1000C Ovenized Crystal Oscillator (OCXO) could be used as a reference as well as other manufacturers’ precise oscillators.
At 344 x 215 x 91mm (13.5 x 8.5 x 3.6 inches), the phase noise test instrument is small enough for integration into manufacturing ATE systems, yet powerful enough for laboratory-grade metrology. The 53100A Phase Noise Analyzer is available now.
