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How to Get into FPGA
The job situation in field-programmable gate arrays (FPGAs) has seen an uptrend in the last few years due to increase in their use in...
“India is An Emerging Platform for Design Implementation”
Vasudevan Aghoramoorthy, vice president, Semiconductor and Systems, Wipro Technologies, spoke to Dilin Anand and Jalaja Ramanunni of EFY about Wipro’s presence in India, how...
Optimise Your Test System Smartly
As higher targets are set to increase profits and decrease operating costs, test engineers are subjected to the ever-increasing stress of improving the efficiency...
“Safety and reliability are two different things”
Texas Instruments, popularly known as TI, helps customers develop new ideas that change the way we live. By providing semiconductor technologies that promote greater...
“Economy is a bigger challenge than technology now”
MAY 2012: NXP Semiconductors provides high-performance mixed signal and standard product solutions that leverage its RF, analogue, power management, interface, security and digital processing...
Integration on smaller geometries is a challenge: Analog Devices
EFY caught up with C M Menon, sales director, Analog Devices at the ISA Vision Summit and discussed the integration challenges and the relevance...
Test & Measurement: What’s Coming Up Next
While today’s technology offers solutions for monitoring or remote reporting via mobile devices, test organisations need new expertise to unite the networking, Web services...
Designing Low Power Products Using MSP430 Microcontroller
The use of battery-operated electronics gadgets is increasing fast in our daily lives. Products are expected to be versatile, while consuming minimal power. Reduced...
Secure Digital Access System using iButton
Access control forms a vital link in a security chain. Here we describe a secure digital access system using iButton that allows only authorised...
T&M Trends For RF Designers
The article looks at the emerging trends and applications in the RF design space which are driving the development of cutting-edge test and measurement...