Thursday, April 24, 2025

Embedded Security Testbench For Simplified Testing

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The integrated, modular platform streamlines complex testing workflows, boosts efficiency, and ensures consistent, repeatable results — all while preparing lab for future security challenges.

Embedded Security Testbench For Simplified Testing

Keysight Technologies, Inc. announced the release of its Next-Generation Embedded Security Testbench, a scalable and high-performance PXIe-based solution designed to simplify and strengthen security testing workflows for modern semiconductors and embedded systems. Developers and security labs face increasingly complex threats as the number of connected devices continues to rise. Traditional security testing setups — often relying on multiple standalone instruments — can create time-consuming workflows, inconsistent results, and limited flexibility.

The key features  are:

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  • Delivers superior test results with best-in-class Keysight measurement devices.
  • User-friendly interface with smart, experience-based algorithms — focus on results, not setup.
  • Future-proof and scriptable testbench for evolving test scenarios.
  • Flexible and compatible with existing test devices.
  • Integrated setup reduces clutter and boosts efficiency.

The solution tackles these challenges by offering a fully integrated, modular platform designed to streamline device vulnerability testing while enhancing performance and repeatability. It has a PXIe-based architecture brings exceptional speed and scalability to hardware security testing. As part of the evolution of the company’s Device Vulnerability Analysis portfolio, this platform delivers significantly enhanced results for critical testing techniques such as side-channel analysis (SCA) and fault injection (FI) — offering up to a tenfold boost in efficiency compared to traditional setups.

The modular design consolidates key testing components — oscilloscopes, signal interfaces, amplifiers, and trigger generators — into a single PXIe chassis. This reduces setup complexity, minimises cabling, and improves communication speeds across modules, allowing teams to accelerate security workflows and maintain greater consistency in test outcomes. It is powered by three core components: the M9046A PXIe Chassis, the M9038A PXIe High-Performance Embedded Controller, and Inspector Software. 

The system’s flexibility allows for easy expansion with additional oscilloscopes, electromagnetic (EM) probes, and other specialized modules, adapting to evolving test scenarios and customer needs. Wei Yan Mao, Director of Operations at Applus+ Laboratories, shared: “We saw the potential of this platform and were eager to integrate it into our accredited IT Security Evaluation Facilities.” Erwin in ’t Veld, Product Manager at Keysight’s Device Security Research Lab, added:”This platform sets a new benchmark in embedded security testing, helping users stay ahead of the threat landscape while preparing for future challenges.”

For more information, click here.

Akanksha Gaur
Akanksha Gaur
Akanksha Sondhi Gaur is a journalist at EFY. She has a German patent and brings a robust blend of 7 years of industrial & academic prowess to the table. Passionate about electronics, she has penned numerous research papers showcasing her expertise and keen insight.

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