FormFactor has developed high-frequency probes, the InfinityXT probe series, for applications requiring ultra-wide bandwidth and wide temperature ranges for device modeling and characterization.
Recently, there has been a demand for RF and microwave devices due to explosive growth in automotive, mobile communications/5G, and IoT device markets. These applications require testing probes with ultra-wide bandwidth and wide temperature ranges for device modeling and characterization. Moreover, the on-wafer measurement applications require high measurement accuracy and repeatability as extracted parameters are highly sensitive to very slight differences.
To cater to all these needs, FormFactor, a provider of test and measurement equipment, has developed high-frequency probes, the InfinityXT probe series, that feature higher temperature range, better tip visibility and durability, and support for narrower pitches. According to the firm, it is setting the benchmark for accuracy and repeatability in the device characterization and modeling.
The probes feature excellent return and insertion loss combined with low and repeatable contact resistance on aluminum pads to ensure high-accuracy S-parameter measurements. It has high-temperature capability (175° C +) for automotive device characterization and other applications. The tip visibility is enhanced for better placement accuracy and repeatability. It comes with an improved tip life/durability with solid rhodium contacts. Moreover, the advanced mechanical design combined with small contacts enables probing on smaller pads/pitches and improves durability and robustness.
