Wednesday, February 19, 2025

Test Solution For AI And Computing

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An LPDDR6 test solution helps check memory performance, speeds up testing, and saves power for AI, computing, mobile devices, data centres, and more.

Keysight Introduces Comprehensive LPDDR6 Solution for End-to-End Memory Design and Test Workflows
Keysight Introduces Comprehensive LPDDR6 Solution for End-to-End Memory Design and Test Workflows

Keysight Technologies, Inc. has introduced a design and test solution for Low-Power Double Data Rate 6 (LPDDR6) memory, addressing the demands of computing and AI. This solution improves device and system validation with test automation tools, supporting AI, mobile, and edge devices.

The need for AI and energy-efficient mobile applications is driving memory market changes. LPDDR6 improves performance and efficiency, making it important for computing systems. However, memory technologies like LPDDR6, HBM4, and GDDR7 have increased testing challenges, requiring accurate and efficient validation methods.

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Keysight’s workflow includes transmitter and receiver test applications and the Advanced Design System (ADS) Memory Designer. Paired with Keysight EDA software and the Memory Designer bundle, the LPDDR6 test solution speeds up the transition from simulation to verification and testing. It is powered by Keysight’s UXR oscilloscope and M8040A Bit Error Ratio Tester.

LPDDR6’s performance and power efficiency apply beyond mobile devices. Its features make it worthwhile for AI, machine learning, computing, automotive systems, data centres, and edge applications that balance processing power and energy use.

LPDDR6 test solution reduces validation time through automated compliance testing and characterization. It enables accurate measurements with low-noise technology, allowing engineers to capture data efficiently. Data analysis tools help debug design issues, while eye mask margin testing assesses device Bit Error Ratio (BER) performance. De-embedding capabilities allow signal measurements directly from BGA packages, improving test accuracy.

The solution supports design validation using a Bit Error Ratio testing methodology. Engineers can detect performance issues by testing against jitter, crosstalk, and noise conditions. BER analysis and receiver equalization optimization help improve signal integrity. The test solution also supports validation for devices and host controllers, ensuring system compatibility.

With support for higher data rates, the test solution improves user experiences. It enhances power efficiency, helping extend battery life in mobile devices and reducing power use in data centres. Data integrity and system stability features help build reliable memory solutions, supporting AI, computing, and other applications.

Nidhi Agarwal
Nidhi Agarwal
Nidhi Agarwal is a Senior Technology Journalist at EFY with a deep interest in embedded systems, development boards and IoT cloud solutions.

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